What phenomenon occurs when there are increased counts at the periphery of the scintillation crystal due to internal reflection of light?

The phenomenon described involves increased counts at the periphery of a scintillation crystal due to the internal reflection of light. This scenario is accurately characterized as edge packing. When photons are produced within the scintillation material, they can reflect off the edges and surfaces of the crystal. This results in a concentration of light being detected at the edges, leading to higher counts in those areas compared to the center of the crystal.

Edge packing plays a significant role in how the spatial distribution of detected events can be influenced by the geometry and structure of the scintillation crystal. It is important in interpreting imaging data accurately, as it can affect the perceived intensity and resolution of the images produced.

Other terms listed, such as window reflection, light scattering, and crystal decay, do not describe the same phenomenon. Window reflection could refer to light interacting with a detector window rather than within the crystal itself. Light scattering involves the random diffusion of light rather than orderly reflection, and crystal decay relates to the loss of scintillation light over time, which is not pertinent to this specific scenario.